muhammad faiz bukhori, andrew r. brown, scott roy, asen asenov.  (2009).  simulation of statistical aspects of reliability in nano cmos transistors.  - ieee international integrated reliability workshop final report 2009, s. lake tahoe ca..  . 

muhammad faiz bukhori, scott roy, asen asenov..  (2008).  statistical simulation of rts amplitude distribution in realistic bulk mosfets subject to random discreet dopants.  - 9th international conference on ultimate integration of silicon, udine..  .